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Surface Analysis by Photoelectrons – Computer Control of Experiments
Polčák, Josef ; Zemek, Josef (referee) ; Cháb, Vladimír (referee) ; Šikola, Tomáš (advisor)
Doctoral thesis is dealing with the methods for analysis of surfaces by photoelectrons being emitted by X-ray radiation. The methods are: X-ray Photoelectron Spectroscopy - XPS, Angle-resolved XPS - ARXPS and X-ray Photoelectron Diffraction - XPD. The work is especially focused on a method of ARXPS, which is used for the depth compositional analysis of sample surfaces. To obtain an information about the depth composition from the measured ARXPS spectra, a calculation software in the Matlab environment has been developed. The software has been tested both for simulated and real sample data. For an experimental implementation of these methods, a complete manipulation system has been developed. It ensures the transport of samples inside a vacuum apparatus and the experiment itself. The system is controlled mainly by a software and enables to run the experiments automatically.
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Electronic structure of bimetallic systems - study of gas molecule interaction
Píš, Igor ; Nehasil, Václav (advisor) ; Bartoš, Igor (referee) ; Polčík, Martin (referee)
Bimetallic Rh-V system was studied by means of surface science experimental methods. Properties of ultra-thin Rh-V layers supported by γ-Al2O3 were compared with model systems prepared by vacuum V deposition on Rh(111), Rh(110) and polycrystalline rhodium. Formation of ordered V- Rh(111)-(2×2), V-Rh(110)-(2×1) and V-Rh(110)-(1×2) subsurface alloys and their electronic and atomic structure were investigated and models of the surface reconstructions were proposed. Influence of the subsurface alloy formation on interaction with CO and O2 molecules as well as the influence of the molecule adsorption on this alloy was investigated. The bond between CO molecules and Rh-V alloy surface was weakened due to pronounced changes in surface valence band structure. Oxygen which adsorbed on the alloy surface reacted with the subsurface vanadium at elevated temperature and blocked the interaction of the metal substrate with CO molecules.
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Physically chemical properties of epitaxial films CeOx/Cu(111)
Duchoň, Tomáš ; Veltruská, Kateřina (advisor) ; Polčík, Martin (referee)
In this work a reversible transition between CeO2/Cu(111) and Ce2O3/Cu(111) was studied by metalic ceria evaporation and oxygen exposition. Prepared layers were characterised by XPS, ISS (and its angle resolved modification), LEED and XPD combined with computer modelling using EDAC code. Four reconstructi- on were identified within the transition - ( √ 7 × √ 7)R19.1◦ , ( √ 3 × √ 3)R30◦ , 3 × 3 and 4 × 4 - for which structural models were suggested. Prepared layers of Ce2O3/Cu(111) exhibiting the 4×4 reconstruction were identified as a cubic pha- se of Ce2O3 by the combination of all methods. The photoelectron spectroscopy study of the chemical state of layers revealed that reduction proceedes from the surface and oxidation is realised by oxygen diffusion into the volume.
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Surface Analysis by Photoelectrons – Computer Control of Experiments
Polčák, Josef ; Zemek, Josef (referee) ; Cháb, Vladimír (referee) ; Šikola, Tomáš (advisor)
Doctoral thesis is dealing with the methods for analysis of surfaces by photoelectrons being emitted by X-ray radiation. The methods are: X-ray Photoelectron Spectroscopy - XPS, Angle-resolved XPS - ARXPS and X-ray Photoelectron Diffraction - XPD. The work is especially focused on a method of ARXPS, which is used for the depth compositional analysis of sample surfaces. To obtain an information about the depth composition from the measured ARXPS spectra, a calculation software in the Matlab environment has been developed. The software has been tested both for simulated and real sample data. For an experimental implementation of these methods, a complete manipulation system has been developed. It ensures the transport of samples inside a vacuum apparatus and the experiment itself. The system is controlled mainly by a software and enables to run the experiments automatically.
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